- Simple, Fast (>2500 measurements/s) and Accurate measurement in two axis
- Compact, No External Controllers
- Easy Installation (Sample Application with Source Code, Macro for Excel)
- Laser Diode 670 nm Class I
- Analog, RS232, USB, Ethernet (SPI, Parallel, others upon request)
- Custom Modes Available (i.e. Centering, Minimum, Maximum thickness, Range of Tolerances)
Measurement Range | 1.10″ (28 mm) |
Resolution | 0.4375 µm |
Repeatability | 3 µm (Edge position, Calibrated Distance) |
Response Time | 0.391 ms |
Non-Linearity | < 10 µm (Edge Position, calibrated distance) |
Measuring Modes | Edge1, Edge2, Diameter, Gap, Center, Solid |
Detection Method | Laser (670 nm Class II Laser Diode) Through-Beam with CCD Element |
Power | 12 to 24 VDC / 120mA |
Connection/Interface | Serial, Parallel, USB, Ethernet, Analog or Custom |
Display | 2 x OLED, 128 x 64 pixels |
Overall Dimensions | 6″ x 5.5″ x 1″ (150 x 137 x 25 mm) |
To download the latest version of XY Studio please visit XY Studio page.